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12-0698 (Reapproved 0615) - Test Method for Measurement of Breakdown Strength of Leadframe Tape
metal-oxide-silicon (MOS) and CMOS technologies is included
2 Materials for analysis include
orgで入手可能となる。初版は1996年に発行，前版は2005年3月に発行された。
This Specification is applicable to plastic tape frames for 300 mm wafers
PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock StdPbc-0819 12-0698 (Reapproved 0615) - TestThis Specification is intended for the quality and the testing method of polyethylene (PE) bags. The quality of PE bags is critical as poor quality PE bags may contaminate polysilicon and cause contamination during transportation. Forming an industry consensus standard will minimize contamination, control the associated costs and improve communication between supplier and user. This Standard will cover the quality criteria and the associated test