Pay in 4 interest-free payments of $37.50 Learn more
Ships within 48 hours · Estimated delivery Jul 30 - Aug 4
Optical measurement methods are widely used to evaluate flatness of substrate
low leakage
1-0621 (Reapproved 0424)
data reports
quartz boats
G03500 - SEMI G35 - Specification for Test Methods for Lead Finishes on Semiconductor (Active) Devices Revision:Default Title Optical measurement methods are widelyThis specification establishes uniform methods and procedures for conducting tests on lead finishes on (active device) electronic packages. Other SEMI Standards establish materials used and the finishes for them. Referenced SEMI Standards SEMI G4 Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes SEMI G18 Integrated Circuit Leadframe Materials Used in the Production of Etched Leadframes SEMI G20 Lead Finishes for
US$ 1075.00
US$ 242.50
US$ 204.00
US$ 900.00
US$ 39.97
US$ 699.00
US$ 137.50
US$ 893.98
US$ 11954.48
US$ 218.47
US$ 236.47
US$ 1375.00